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Applied Microscopy
Fig. 2 | Applied Microscopy

Fig. 2

From: Noise reduction of electron holography observations for a thin-foiled Nd-Fe-B specimen using the wavelet hidden Markov model

Fig. 2

Observation of a thin-foiled Nd2Fe14B specimen by electron holography. a TEM image of the Nd2Fe14B specimen. The yellow rectangular area in (a) indicates the field view for electron holograms in (d). b Schematic of the thin-foiled specimen. c Visibility of electron holograms as a function of the voltage of upper biprism (lower horizontal axis) and fringe spacing (upper horizontal axis). d Series of electron holograms acquired at fringe spacings of 5.2 nm, 2.4 nm, and 1.7 nm, corresponding to VBP1 of \(-\)50 V, \(-\) 110V, and \(-\)150 V, respectively

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