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Applied Microscopy
Fig. 2 | Applied Microscopy

Fig. 2

From: Advanced atomic force microscopy-based techniques for nanoscale characterization of switching devices for emerging neuromorphic applications

Fig. 2

Surface morphology changes in the switching layer when voltage is applied to a film via C-AFM. a The surface of an Ag/Ge0.25Se0.75 film applied with + 200 mV (Vwr) shows images of local morphology (left) and 2D current mapping (right). b The surface of an Ag/Ge0.25Se0.75 film applied with − 250 mV (Ver) shows images of local morphology (left) and 2D current mapping (right). c I-V curves: (1) writing step, (2) on-state, (3) erasing step, and (4) off-state. Reprinted from Pradel et al. (2011) (Phys. Status Solidi A 208, 2303–2308) with Physica Status Solidi A’s permission

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