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Applied Microscopy
Fig. 3 | Applied Microscopy

Fig. 3

From: TEM sample preparation using micro-manipulator for in-situ MEMS experiment

Fig. 3

Transferring process of h-BN 2D flakes on MEMS window from AAO filter a SEM image of h-BN flakes dispersed on AAO. b Transferring process observed by optical microscopy in real time using tip of radius < 100 nm. c TEM image of transferred h-BN single flake on MEMS window. The inset shows low magnification TEM image of sample. d Corresponding SAED pattern of red circled part in c. e STEM-BF image of transferred h-BN flake. Inset reveals the high-magnification image of atomic column of B and N

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