Fig. 2From: TEM sample preparation using micro-manipulator for in-situ MEMS experimentSchematic illustrations of mechanism of intensifying electrostatic force via biasing on tip (a-b) a attractive force induced by positive charge biasing and b repulsive force by negative charge biasing on tip where the surface of dielectric sample has negative charges. c-d Attractive force in conductive specimen induced by both c positive charge biasing and d negative charge biasing on tipBack to article page