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Fig. 2 | Applied Microscopy

Fig. 2

From: TEM sample preparation using micro-manipulator for in-situ MEMS experiment

Fig. 2

Schematic illustrations of mechanism of intensifying electrostatic force via biasing on tip (a-b) a attractive force induced by positive charge biasing and b repulsive force by negative charge biasing on tip where the surface of dielectric sample has negative charges. c-d Attractive force in conductive specimen induced by both c positive charge biasing and d negative charge biasing on tip

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