Fig. 3From: Mechanical removal of surface residues on graphene for TEM characterizationsEDX investigation of residue aggregation induced by mechanical sweeping. a Schematic side view showing PDMS residue aggregated by mechanical sweeping. b EDX mapping around the residue aggregation. HAADF-STEM, oxygen K edge, silicon K edge, and carbon K edge mapping images are shown from left to rightBack to article page