Fig. 2
From: Mechanical removal of surface residues on graphene for TEM characterizations
AFM and TEM investigation of mechanical cleaning of graphene surface residues. a Optical microscope image of a graphene flake exfoliated on the PDMS film. b Graphene flake transferred on a holey Si3N4 membrane TEM grid. c Close-up optical image. The hole in the dashed square was used for AFM scanning shown in panel (d). d AFM topography image of the as-prepared graphene near a hole in the Si3N4 membrane. The red dashed box indicates the AFM sweeping area. e AFM topography image obtained after the mechanical cleaning process. The dashed circle is the field of view of the STEM imaging shown in panel (f). f HAADF-STEM image of the partially cleaned graphene sample