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Fig. 1 | Applied Microscopy

Fig. 1

From: Mechanical removal of surface residues on graphene for TEM characterizations

Fig. 1

Schematics of the AFM-based mechanical cleaning process of a TEM sample. a Schematic illustration of the sample fabrication of graphene on a Si3N4 TEM grid membrane by PDMS-based stamping. b Schematic illustration of AFM-based cleaning of PDMS residue on a graphene TEM grid. c Side-view schematic of AFM-based cleaning. PDMS residues on the graphene’s top surface are removed by AFM-based scanning

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