Fig. 1From: Sequential conversion from line defects to atomic clusters in monolayer WS2a–c ADF-STEM images showing the formation of atomic clusters at edges of a hole in the monolayer WS2. d ADF-STEM image showing extended holes with line defects and clusters. e–h Simple successive schematics showing a whole process for the formation of clusters and holes from line defects in the monolayer WS2 sheetBack to article page