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Table 1 Imaging methodology for interface analysisa

From: Scanning acoustic microscopy for material evaluation

Technology Highest lateral resolution Highest depth resolution Scanning time
Infrared 250 μm 250 μm 3 min
X-ray tomography 10 μm >  2 μm 30 min
Scanning Acoustic Microscope < 1 μm 1 μm 2–8 min
Optical Microscope 0.3 μm 1 μm 5 min
Transmission Electron Microscope 0.1 nm 50 nm 60 min
  1. asome data courtesy of PVA TePla Analytical System