Fig. 4From: The LaserFIB: new application opportunities combining a high-performance FIB-SEM with femtosecond laser processing in an integrated second chamberScanning electron micrograph of a WC island milled into a bulk sample surface. The island is 180 μm on wide and 120 μm high and was milled in 85 s using the ZEISS Crossbeam LaserBack to article page