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Applied Microscopy
Fig. 1 | Applied Microscopy

Fig. 1

From: Methods to evaluate the twin formation energy: comparative studies of the atomic simulations and in-situ TEM tensile tests

Fig. 1

Micrographs of (a) Al NW grown on the SiO2 substrate and (b) its cross-sectional view. c Secondary electron image showing the push-to-pull (PTP) loading device, which converts a compressive load to a tensile load. d-f Magnified views of the rectangle denoted in (c); d The Al NW transported to the PTP loading device by picking up with the W tip of the nanomanipulator. The NW welded to the PTP device using e-beam assisted Pt deposition viewed from the (e) top and (f) side

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