Table 1 Meta information of EEL SR data

 Element:

Ti

 Formula:

TiO₂

 Name:

Titanium

 Classes:

Element

 Sample Production Method:

Standard Materials

TED PELLA-18241

 Specimen Preparation Method:

FIB

 Specimen Type:

Bulk

 Relative Thickness (t/λ):

0.73

 Microscope Name / Model:

JEOL

 Gun Type:

Cold FEG

 Detector:

GIF965-ER

 Acquisition Mode:

Diffraction mode

 Convergence Semi-angle (mrad):

0.001

 Collection Semi-angle (mrad):

10.4

 Beam Current (pA):

100

 Incident Beam Energy (keV):

200

 Best Energy Resolution (eV):

0.33

 Incident Beam Energy (keV):

200

 Energy Resolution (eV):

0.33

 Vacuum status

1.10E-05

 Dispersion (eV/pixel)

0.05

 Data Range (eV)

446–548

 ZLP Resolution (eV):

0.65

 High-Loss Exposure Time (sec):

2.0

 Number of Readouts (times):

100

 Edge Energy (eV):

457.4

 Extended Uncertainty (eV):

0.6

 Dispersion (eV/pixel):

0.1

 Data Range (eV):

436–641

 ZLP Resolution (eV):

0.8

 High-Loss Exposure Time (sec):

1.0

 Number of Readouts (times):

100

 Edge Energy (eV):

457.4

 Extended Uncertainty (eV):

0.6

 Dispersion (eV/pixel):

0.25

 Data Range (eV)

406–918

 ZLP Resolution (eV):

1.5

 High-Loss Exposure Time (sec):

0.5

 Number of Readouts (times):

100

 Edge Energy (eV):

457.4

 Extended Uncertainty (eV):

1.0