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Fig. 1 | Applied Microscopy

Fig. 1

From: Analyzing the microstructure and related properties of 2D materials by transmission electron microscopy

Fig. 1

ADF-STEM images showing stacked bilayer MoS2. a ADF-STEM image of the tip region of stacked bilayer MoS2. b ADF-STEM image showing the extended bilayer MoS2 step edge. c Magnified image of the small region in (a). d Atomic model based on (c) showing both projection and side views. e Multi-slice ADF-STEM image simulation corresponding to the atomic model in (d). f Intensity line comparison between the simulated and experimental image of the site terminated with S2 atoms. g Intensity line comparison between the simulated and experimental image of the site terminated with Mo + S2 atoms. Reprinted from Wang et al. (2017) (Nanoscale 9, 13,060–13,068) with Nanoscale’s permission

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